Reliability Testing: Accelerated Testing Services | NEXTY Electronics Quality & Analysis Support | NEXTY Electronics, a trading company for electronic components and semiconductors.

Reliability Testing: What Is Accelerated Testing?

Accelerated testing is a method that uses acceleration factors such as temperature, humidity, voltage, and current to speed up the degradation of the sample under evaluation, allowing its deterioration to be assessed in a short period of time. For example, by performing accelerated testing, it is possible to evaluate approximately 30 years’ worth of degradation in about 1,000 hours. This estimate is based on the Arrhenius model for high-temperature storage testing under the following conditions: usage temperature of 40 °C, test temperature of 125 °C, storage time of 1,008 hours, and activation energy of 0.7 eV. While verifying lifetime and degradation through actual 30-year usage would provide highly accurate results, it is impractical for product design and development due to the time required. Therefore, we recommend using accelerated testing, which enables lifetime prediction and degradation evaluation in a much shorter timeframe. NEXTY Electronics offers reliability testing equipment at reasonable cost. Please take advantage of our services.

NEXTY Electronics Reliability Testing: Accelerated Testing

We combine reliability testing (accelerated testing) with good product analysis and cross-section analysis to provide comprehensive evaluation.
With NEXTY Electronics, you can access reliability test chambers at a reasonable cost.

In addition to standard accelerated testing, we also offer detailed investigations of evaluation samples after testing, including good product analysis and cross-section analysis to assess the degree of degradation.
For test requests, inquiries about equipment availability, specifications, or any other requirements, please feel free to contact us.
Please note: If our in-house equipment is fully booked or if the requested equipment is outside our scope, we may outsource to trusted external partners.

Owned Accelerated Testing Equipment

Equipment Name	Manufacturer	Model	SPEC	Internal Dimensions (W × H × D)
Thermostatic Chamber	ESPEC	ST-120	20–200°C	400 × 280 × 350 mm × 1 level
Thermostatic Chamber	ADVANTECH	DRJ633DA	20–370°C	600 × 600 × 600 mm × 1 level
Temperature Cycle Chamber	ESPEC	TSE-11	Low temp: –60–0°C High temp: 60–200°C	320 × 130 × 230 mm × 2 levels
Temperature Cycle Chamber	ESPEC	TSA-103EL-A	Low temp: –60°C High temp: 60–200°C	650 × 460 × 370 mm × 1 level
Condensation Cycle Chamber *Temperature and Humidity Control Range Available	ESPEC	PL-1J	Temp: –40–100°C Humidity: 20–98% RH	500 × 600 × 400 mm × 1 level
	ESPEC	SH-241	Temp: –40–150°C Humidity: 30–95% RH	300 × 300 × 250 mm × 1 level
Constant Temperature & Humidity Chamber *Temperature and Humidity Control Range Available	ESPEC	PH-3KT	Temp: 10–100°C Humidity: 60–98% RH	600 × 850 × 800 mm × 1 level
	IMV	THC-64	Temp: 25–90°C Humidity: 40–95% RH	400 × 500 × 320 mm × 1 level
HAST/PCT Chamber	HIRAYAMA	PC422R8	105.0–133.3°C (at 100% RH) 110.0–140.0°C (at 85% RH) 118.0–150.0°C (at 65% RH)	(φ)340 mm (D) × 4750 mm × 1 chamber

Thermostatic chamber
（ST-120）
Temperature cycle chamber
（TSA-103EL-A）
Condensation Cycling Chamber
（PL-1J）

Constant Temperature and Humidity Chamber
（H-3KT）
HAST / Highly Accelerated Stress Test Chamber
（PC422R8）

Reliability Testing: Accelerated Testing Items

Accelerated Test Item	Accelerated Stress Factor	Application Example	Equipment Used
High-Temperature Test (*1)	Chemical reaction due to temperature	Whisker; Stress migration; Electromigration (*2); etc	Thermostatic chamber
Temperature Cycle Test (*1)	Stress caused by expansion and contraction	Whisker; Solder crack; Passivation crack; etc	Temperature cycle chamber
Condensation Cycle Test (*1)	Stress caused by expansion and contraction; Chemical reaction due to humidity	Whisker; Electrochemical migration (*3); Corrosion; etc	Condensation cycle chamber
High-Temperature and High-Humidity Test (*1)	Chemical reaction due to humidity	Whisker; Corrosion; Moisture absorption; Electrochemical migration (*3); etc	Constant temperature and humidity chamber
UHAST (*1)	Chemical reaction due to humidity	Accelerated testing possible in 1/10 of the time required for high-temperature and high-humidity tests (restrictions may apply depending on sample)	HAST/PCT chamber

(*1) In addition to the above accelerated stress factors, voltage and current application is also possible
(*2) Current application is required for this accelerated stress factor
(*3) Voltage application is required for this accelerated stress factor

Request Process

Inquiries and quotations are free of charge.
Our services are available for devices other than those handled by NEXTY Electronics.
Please feel free to contact us if you are interested.

1． Inquiry

Submit your request via the inquiry form, including details such as sample information, quantity, budget, and desired delivery date.
If you have related documents, please send them together. (Sample information and budget can be provided within the range you are comfortable sharing.)

2． Response and Quotation

A NEXTY Electronics representative will review your inquiry and confirm details during a hearing session.
We will check the analysis content, feasibility, and any additional requirements, then provide an estimate and delivery schedule.
After reviewing the analysis details, quotation, and delivery date, if you decide to proceed, we will send a formal quotation.

3．Order Placement and Shipment of Analysis Samples

Please send us your official order form. Upon receipt, we will begin the analysis process.
The shipping address for samples will be provided by NEXTY Electronics.

4． Analysis Execution

We will perform the requested analysis.
If you require interim results, we can provide a mid-term report upon request.
Examples:
Report before moving from non-destructive to destructive analysis
Early results for large-volume analysis

5．Report Delivery

The analysis results will be compiled into a report and sent to you.
If you have any questions or require clarification, please feel free to contact us.

6． Payment and Sample Return

After acceptance, NEXTY Electronics will return the samples along with the invoice, receipt, and delivery note.
Please proceed with payment accordingly.

Contact Us

We accept consultations, questions, and quotation requests via the button below.
Our services are available for devices other than those handled by NEXTY Electronics.
For quotation requests, including the following information will help us respond smoothly:
Even if the information is not listed, please feel free to contact us. Once confirmed, a representative will get back to you.

Required Information for Quotation Request：
Request details：
Sample information：
Quantity：
Budget：
Desired delivery date：

Request a Quote / Contact Us

Our Service Locations

Aichi OfficeTAQS（Toyotsu Automotive Quality Support Center)

Location	Toyotsu Logistics Services Bldg 4Fl. 1-3 Oonawa, Ozaki-cho, Anjyo, Aichi, 446-0004, Japan
Supported Services	Failure analysis, Good Product Analysis, Reliability Testing: Accelerated Testing, Cross-section analysis

Key Points of Our Quality and Analysis Service Locations

At NEXTY Electronics’ VA Center Division, we provide reliable quality and analysis services you can rely on, supported by a comprehensive framework as outlined below.