What Is Cross-Section Analysis?

Cross-section analysis is a technique used to examine the internal structure and properties of materials or components by observing and analyzing their cross-sections.
By performing cross-sectional observation, it is possible to gain detailed insights into internal structures, defects, microstructures, and crystal structures. This method is essential for evaluating material characteristics and quality, making it an indispensable technology in design, development, and quality control.

Applications of Cross-Section Analysis

The purposes of cross-sectional observation vary widely, but common cases include:

  • Observation of Internal Structure
    Reveal the internal structure of materials or components and confirm crystal structure, phase structure, fiber orientation, and layer configuration.
  • Detection of Defects
    Identify internal defects such as cracks, voids, and foreign material contamination to evaluate product quality and reliability.
  • Evaluation of Joints
    Assess the quality of welds or adhesive joints and verify the strength and consistency of bonding areas.

NEXTY Electronics Cross-Section Analysis

NEXTY Electronics offers two types of cross-section analysis: mechanical cross-section polishing and ion milling.

1. Mechanical Cross-Section Polishing

Mechanical cross-section polishing uses a mechanical method to polish materials.
It is suitable for processing large areas or thick samples; however, due to stress during polishing, fine scratches or rounding may occur on the polished surface.

ネクスティ エレクトロニクスの断面解析で使用する機械断面研磨装置 TOP TECH PLATOの画像

Mechanical Cross-Section Polishing Equipment
TOP TECH PLATO
Processing Range: Max. Φ30 mm

  • Solder ball cracks in BGA

  • Cracks at the neck of aluminum wires

  • Quality inspection of PCB through-holes

  • Lead Cross-Section and Plating Thickness Measurement / EDX Mapping of Plating Material
    Sn (tin) detected in the plated area (yellow region) by EDX elemental identification.

2. Ion Milling

Ion milling uses an ion beam to process surfaces with high precision.
It is suitable for observing fine structures; however, its processing range is narrower than that of mechanical cross-section polishing.
Therefore, selecting the appropriate method based on the application and sample characteristics is essential.

Ion milling includes two types: flat milling and cross-section milling.

イオンミリング装置 日立ハイテク製 ArBlade5000の画像

Ion Milling Equipment
Hitachi High-Tech ArBlade5000
Processing Range: Flat milling: Φ30 mm
Cross-section milling: 1–5 mm

Flat Milling

Flat milling is mainly used to remove scratches or rounding left after mirror finishing by mechanical cross-section polishing.
Its advantage is the wide processing range (approximately Φ30 mm).
However, the processing depth is shallow (a few μm to about 10 μm), so if deep scratches or rounding remain after mirror finishing, flat milling alone may not completely remove them.

Cross-Section Milling

Cross-section milling removes material using an ion beam starting approximately 100–200 μm before the target area, so the intended surface does not receive direct stress.
This allows for a smooth finish even on materials that are prone to deformation or fracture under stress.
However, the processing range is relatively narrow (about 1–5 mm), making cross-section milling more limited compared to flat milling.

Ion Milling Example

Cross-section milling removes material using an ion beam starting approximately 100–200 μm before the target area, so the intended surface does not receive direct stress.
This enables a smooth finish even on materials that are easily deformed or damaged by stress.
On the other hand, the processing range is limited to about 1–5 mm, which is narrower than flat milling.

ネクスティ エレクトロニクスの断面解析例:平面ミリング Pbフリーはんだ合金層断面の画像

PCB Board – Flat Milling of Pb-Free Solder Alloy Layer

Mechanical cross-section polishing alone does not clearly reveal the shape of the Cu-Sn alloy region. By applying flat milling, the shape becomes distinct, allowing accurate measurement of the alloy layer thickness.

ネクスティ エレクトロニクスの断面解析例:断面ミリング Auボンディング-Alパッド接合部断面の画像

Cross-Section Milling – Au Bonding / Al Pad Joint Cross-Section

When observing the bonding joint in cross-section, mechanical polishing often causes the Al pad to break due to stress, making it difficult to obtain a clean cross-section.
With cross-section milling, the sample is removed using only an ion beam without applying mechanical stress, allowing the joint to be observed without damaging the Al pad.

Choosing Between Mechanical Cross-Section Polishing and Ion Milling

For large-area observations such as solder cracks, PCB layer quality, or lead plating thickness, mechanical cross-section polishing is recommended.
For fine structures such as bonding joints or intermetallic alloy connections, ion milling is the preferred method.
NEXTY Electronics proposes and provides the most suitable cross-section analysis method according to your purpose and application.

Request Process

Inquiries and quotations are free of charge.
Our services are available for devices other than those handled by NEXTY Electronics.
Please feel free to contact us if you are interested.

1. Inquiry

Submit your request via the inquiry form, including details such as sample information, quantity, budget, and desired delivery date.
If you have related documents, please send them together. (Sample information and budget can be provided within the range you are comfortable sharing.)

2. Response and Quotation

A NEXTY Electronics representative will review your inquiry and confirm details during a hearing session.
We will check the analysis content, feasibility, and any additional requirements, then provide an estimate and delivery schedule.
After reviewing the analysis details, quotation, and delivery date, if you decide to proceed, we will send a formal quotation.

3.Order Placement and Shipment of Analysis Samples

Please send us your official order form. Upon receipt, we will begin the analysis process.
The shipping address for samples will be provided by NEXTY Electronics.

4. Analysis Execution

We will perform the requested analysis.
If you require interim results, we can provide a mid-term report upon request.
Examples:
Report before moving from non-destructive to destructive analysis
Early results for large-volume analysis

5.Report Delivery

The analysis results will be compiled into a report and sent to you.
If you have any questions or require clarification, please feel free to contact us.

6. Payment and Sample Return

After acceptance, NEXTY Electronics will return the samples along with the invoice, receipt, and delivery note.
Please proceed with payment accordingly.

Contact Us

We accept consultations, questions, and quotation requests via the button below.
Our services are available for devices other than those handled by NEXTY Electronics.
For quotation requests, including the following information will help us respond smoothly:
Even if the information is not listed, please feel free to contact us. Once confirmed, a representative will get back to you.

Required Information for Quotation Request:
Request details:
Sample information:
Quantity:
Budget:
Desired delivery date:

Our Service Locations

Aichi OfficeTAQS(Toyotsu Automotive Quality Support Center)

LocationToyotsu Logistics Services Bldg 4Fl. 1-3 Oonawa, Ozaki-cho, Anjyo, Aichi, 446-0004, Japan
Supported ServicesFailure analysis, Good Product Analysis, Reliability Testing: Accelerated Testing, Cross-section analysis

NEXTY Electronics’ VA Center Division operates two locations to provide quality and analysis services to our customers: the VAC (Value Adding Center) in Tokyo and the TAQS (Toyotsu Automotive Quality Support Center) in Aichi Prefecture.
We will respond from the location that can deliver the services you require. If you have any requests, please contact us using the inquiry button below.

Key Points of Our Quality and Analysis Service Locations

At NEXTY Electronics’ VA Center Division, we provide reliable quality and analysis services you can rely on, supported by a comprehensive framework as outlined below.

  • Building Facilities

Robust Earthquake-resistant Structure

  • Security

Surveillance Camera Monitoring, Access Control System

  • Work Environment

Temperature and Humidity Control Anti-static Measures

View More Quality & Analysis Services